Nordic Semiconductor /nrf5340_application /SAADC_NS /CH[7] /CONFIG

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Interpret as CONFIG

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 (Bypass)RESP 0 (Bypass)RESN 0 (Gain1_6)GAIN0 (Internal)REFSEL 0 (3us)TACQ0 (SE)MODE 0 (Disabled)BURST

REFSEL=Internal, RESP=Bypass, MODE=SE, GAIN=Gain1_6, BURST=Disabled, TACQ=3us, RESN=Bypass

Description

Description cluster: Input configuration for CH[n]

Fields

RESP

Positive channel resistor control

0 (Bypass): Bypass resistor ladder

1 (Pulldown): Pull-down to GND

2 (Pullup): Pull-up to VDD

3 (VDD1_2): Set input at VDD/2

RESN

Negative channel resistor control

0 (Bypass): Bypass resistor ladder

1 (Pulldown): Pull-down to GND

2 (Pullup): Pull-up to VDD

3 (VDD1_2): Set input at VDD/2

GAIN

Gain control

0 (Gain1_6): 1/6

1 (Gain1_5): 1/5

2 (Gain1_4): 1/4

3 (Gain1_3): 1/3

4 (Gain1_2): 1/2

5 (Gain1): 1

6 (Gain2): 2

7 (Gain4): 4

REFSEL

Reference control

0 (Internal): Internal reference (0.6 V)

1 (VDD1_4): VDD/4 as reference

TACQ

Acquisition time, the time the ADC uses to sample the input voltage

0 (3us): 3 us

1 (5us): 5 us

2 (10us): 10 us

3 (15us): 15 us

4 (20us): 20 us

5 (40us): 40 us

MODE

Enable differential mode

0 (SE): Single-ended, PSELN will be ignored, negative input to ADC shorted to GND

1 (Diff): Differential

BURST

Enable burst mode

0 (Disabled): Burst mode is disabled (normal operation)

1 (Enabled): Burst mode is enabled. SAADC takes 2^OVERSAMPLE number of samples as fast as it can, and sends the average to Data RAM.

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