REFSEL=Internal, RESP=Bypass, MODE=SE, GAIN=Gain1_6, BURST=Disabled, TACQ=3us, RESN=Bypass
Description cluster: Input configuration for CH[n]
RESP | Positive channel resistor control 0 (Bypass): Bypass resistor ladder 1 (Pulldown): Pull-down to GND 2 (Pullup): Pull-up to VDD 3 (VDD1_2): Set input at VDD/2 |
RESN | Negative channel resistor control 0 (Bypass): Bypass resistor ladder 1 (Pulldown): Pull-down to GND 2 (Pullup): Pull-up to VDD 3 (VDD1_2): Set input at VDD/2 |
GAIN | Gain control 0 (Gain1_6): 1/6 1 (Gain1_5): 1/5 2 (Gain1_4): 1/4 3 (Gain1_3): 1/3 4 (Gain1_2): 1/2 5 (Gain1): 1 6 (Gain2): 2 7 (Gain4): 4 |
REFSEL | Reference control 0 (Internal): Internal reference (0.6 V) 1 (VDD1_4): VDD/4 as reference |
TACQ | Acquisition time, the time the ADC uses to sample the input voltage 0 (3us): 3 us 1 (5us): 5 us 2 (10us): 10 us 3 (15us): 15 us 4 (20us): 20 us 5 (40us): 40 us |
MODE | Enable differential mode 0 (SE): Single-ended, PSELN will be ignored, negative input to ADC shorted to GND 1 (Diff): Differential |
BURST | Enable burst mode 0 (Disabled): Burst mode is disabled (normal operation) 1 (Enabled): Burst mode is enabled. SAADC takes 2^OVERSAMPLE number of samples as fast as it can, and sends the average to Data RAM. |